Transmission Electron Microscopy Characterization of Nanomaterials

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Bibliografische Daten
ISBN/EAN: 9783642389337
Sprache: Englisch
Umfang: ix, 717 S., 138 s/w Illustr., 264 farbige Illustr.
Auflage: 1. Auflage 2013
Einband: gebundenes Buch

Beschreibung

Third volume of a 40volume series on nanoscience and nanotechnology, edited by the renowned scientist Challa S.S.R. Kumar. This handbook gives a comprehensive overview about Transmission electron microscopy characterization of nanomaterials. Modern applications and state-of-the-art techniques are covered and make this volume an essential reading for research scientists in academia and industry.

Autorenportrait

InhaltsangabeTEM Characterization of Biological and Inorganic Nanocomposites.- Electron Microscopy of Thin Film Inorganic and Organic Photovoltaic Materials.- TEM for Characterization of Semiconductor Nanomaterials.- Study of Polymeric Nano-Composites by 3D-TEM and Related Techniques.-TEM for Characterization of Nanowires and Nanorods.- TEM for Characterization of Core-Shell Nanomaterials.- Valence Electron Spectroscopy by Transmission Electron Microscopy.- TEM Characterization of Nanocomposite Materials.- High Resolution in STEM Mode: Individual Atom Analysis in Semiconductor Nanowires.- Electron Microscopy for Characterization of Thermoelectric Nanomaterials.- TEM for Characterization of Nanocomposites Oxide Thin Films: A Case Study on Solution-Derived Lanthanum Strontium Manganites.- TEM Characterization of Metallic Nanocatalysts.- 3D Electron Microscopy Applied to Nanoscience.-Transmission Electron Microscopy of 1D-Nanostructures

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Springer Verlag GmbH
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