InhaltsangabePREFACE PART ONE: Scaling and Challenge of Si-based CMOS SCALING AND LIMITATION OF SI-BASED CMOS Introduction Scaling and Limitation of CMOS Toward Alternative Gate Stacks Technology Improvements and Alternative to CMOS Technologies Potential Technologies Beyond CMOS Conclusions PART TWO: High-k Deposition and Materials Characterization ISSUES IN HIGH-K GATE DIELECTRICS AND ITS STACK INTERFACES Introduction Highk Dielectrics Metal Gates Integration of High-k Gate Dielectrics with Alternative Channel Materials Summary UV ENGINEERING OF HIGH-K THIN FILMS Introduction Gas Discharge Generation of UV (Excimer) Radiation Excimer Lamp Sources Based on Silent Discharges Predeposition Surface Cleaning for High-k Layers UV Photon Deposition of Ta2O5 Films Photoinduced Deposition of Hf1_xSixOy Layers Summary ATOMIC LAYER DEPOSITION PROCESS OF HF-BASED HIGH-K GATE DIELECTRIC FILM ON SI SUBSTRATE Introduction Precursor Effect on the HfO2 Characteristics Doped and Mixed High-k Summary STRUCTURAL AND ELECTRICAL CHARACTERISTICS OF ALTERNATIVE HIGH-K DIELECTRICS FOR CMOS APPLICATIONS Introduction Requirement of High-k Oxide Materials RareEarth Oxide as Alternative Gate Dielectrics Structural Characteristics of High-k RE Oxide Films Electrical Characteristics of High-k RE Oxide Films Conclusions and Perspectives HYGROSCOPIC TOLERANCE AND PERMITTIVITY ENHANCEMENT OF LANTHANUM OXIDE (LA2O3) FOR HIGH-K GATE INSULATORS Introduction Hygroscopic Phenomenon of La2O3 Films Low Permittivity Phenomenon of La2O3 Films Hygroscopic Tolerance Enhancement of La2O3 Films Hygroscopic Tolerance Enhancement of La2O3 Films by Ultraviolet Ozone Treatment Thermodynamic Analysis of Moisture Absorption Phenomenon in High-k Gate Dielectrics Permittivity Enhancement of La2O3 Films by Phase Control Summary CHARACTERIZATION OF HIGH-K DIELECTRIC INTERNAL STRUCTURE BY X-RAY SPECTROSCOPY AND REFLECTOMETRY: NEW APPROACHES TO INTERLAYER IDENTIFICATION AND ANALYSIS Introduction Chemical Bonding and Crystalline Structure of Transition Metal Dielectrics NEXAFS Investigation of Internal Structure Studying the Internal Structure of High-K Dielectric Films by Hard X-Ray Photoelectron Spectroscopy and TEM Studying the Internal Structure of High-K Dielectric Films by X-ray Reflectometry HIGHK INSULATING FILMS ON SEMICONDUCTORS AND METALS: GENERAL TRENDS IN ELECTRON BAND ALIGNMENT Introduction Band Offsets and IPE Spectroscopy Silicon/Insulator Band Offsets Band Alignment at Interfaces of High-Mobility Semiconductors Metal/Insulator Barriers Conclusions PART THREE: Challenge in Interface Engineering and Electrode INTERFACE ENGINEERING IN THE HIGH-K DIELECTRIC GATE STACKS Introduction Highk Oxide/Si Interfaces Metal Gate/High-k Dielectric Interfaces Chemical Tuning of Band Alignments for Metal Gate/High-k Oxide Interfaces Summary and Discussion INTERFACIAL DIPOLE EFFECTS ON HIGH-K GATE STACKS Introduction Metal Gate Consideration Interfacial Dipole Effects in High-k Gate Stacks Observation of the Interfacial Dipole in High-k Stacks Summary METAL GATE ELECTRODE FOR ADVANCED CMOS APPLICATION The Scaling and Improved Performance of MOSFET Devices Urgent Issues about MOS Gate Materials for Sub-0.1 mm Device Gate Stack New Requirements of MOS Gate Materials for Sub-0.1 mm Device Gate Stack Summary PART FOUR: Development in non-Si-based CMOS technology METAL GATE/HIGH-K CMOS EVOLUTION FROM SI TO GE PLATFORM Introduction Highk/Si CMOSFETs Highk/Ge CMOSFETs Ge Platform Conclusions THEORETICAL PROGRESS ONGAAS (001)SURFACE ANDGAAS/HIGH-K INTERFACE Introduction Computational Method GaAs Surface Oxidation and Passivation Origin of Gap States at the High-k/GaAs Interface and Interface Passivation Conclusions III V MOSFETS WITH ALD HIGHK GATE DIELECTRICS Introduction Buried Channel InGaAs MOSFETs

Gang He is Professor at the School of Physics and Materials Science of the Anhui University, China. He obtained his academic degrees from the Institute of Solid State Physics of the Chinese Academy of Sciences. His research interests and efforts cover the areas of the preparation, characterization, fundamental understanding and associated applications of high-k gate dielectric thin films in novel devices. Due to his outstanding performance in research work, Professor Gang He won a scholarship award from the Chinese Academy of Sciences in 2005 and a grant of the Japanese Society for the Promotion of Science in 2006. Zhaoqi Sun is the President of the School of Physics and Materials Science at the Anhui University. He graduated from Sichuan University and obtained his academic degrees from the University of Science and Technology of China. His research is focused on functional thin film materials for applications in microelectronics and solar cells. Professor Zhaoqi Sun has authored more than 140 scientific publications and has received numerous scientific awards, including the Science and Technology Award of the AnhuiProvince and an Outstanding Teacher Award.

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